Business Meetings

Each year the Rasch Measurement SIG hosts a Business Meeting at the AERA annual conference. The meeting consists of a brief presentation about SIG business details followed by an engaging presentation from an invited speaker. The Rasch SIG has a rich history of dynamic speakers with engaging presentation topics (see below). This tradition has led to historically high Business Meeting attendance. The 2013 Business Meeting promises to be exciting as well. Please make plans to attend. See you in San Francisco!

Year Chair Secretary Program Chair Business Meeting Speaker (and Presentation Topic)
1987 Benjamin Wright & Richard Smith launch the SIG
1988 Benjamin Wright Richard Smith Richard Smith Ben Wright - “Georg Rasch and measurement”
1989 Benjamin Wright Richard Smith Richard Smith David Andrich - “The scientific revolution in social measurement”
Wim van der Linden - “Derivation of the Rasch model”
1990 David Andrich Mike Linacre Mary Lunz Barry McGaw - “Rasch scaling for monitoring and reporting on educational systems”
Ben Wright - “Differences between scores and measures”
1991 David Andrich Mike Linacre Mary Lunz David Andrich & Wim van der Linden - “The foundations of measurement”
1992 Wim van der Linden Anne Fisher Mary Lunz Richard Woodcock - “Rasch technology and test engineering”
Jack Stenner - “Meaning and method in reading comprehension measurement”
1993 Wim van der Linden Anne Fisher Mary Lunz Ben Wright - “North American perspective on Rasch model”
Eddy Roskam - “European perspective on Rasch model”
1994 George Engelhard, Jr. Carol Myford Betty Bergstrom & Richard Gershon John de Jong & Grant Henning - “Language testing with Rasch measurement”
1995 George Engelhard, Jr. Carol Myford Richard Smith Paul Holland - “The Rasch model and log-linear models for contingency tables”
1996 Geoff Masters Betty Bergstrom Richard Smith Robert Mislevy - "Postmodern test theory"
1997 Geoff Masters Betty Bergstrom Richard Smith John Keeves
1998 Allen Heinemann Rita Bode Richard Smith B. Wright, D. Andrich, W. van der Linden, G. Engelhard, Jr., & G. Masters - “Rasch Measurement SIG 10th Anniversary: Where have we been? Where are we going?”
1999 Allen Heinemann Rita Bode Richard Smith G. Engelhard, Jr., E. Gonzales, R. Hess, L. Ludlow, & J. Monsaas
“Forum: Explaining measurement to non-specialists”
2000 Mary Lunz Thomas O’Neill George Karabatsos Ben Wright - “Banking mixed rating scales”
2001 Mary Lunz Thomas O’Neill George Karabatsos
2002 Trevor Bond Ed Wolfe George Karabatsos
2003 Trevor Bond Ed Wolfe Randy Schumacker David Andrich - “A trade-off between consistency of responses and precision of measurement”
2004 Randy Schumacker Steve Stemler Trevor Bond Richard Smith - "History of Rasch Measurement"
2005 Randy Schumacker Steve Stemler Trevor Bond Jean-Guy Blais - “The impact of Rasch measurement in Francophone countries”
2006 Thomas O’Neill Ed Wolfe William P. Fisher & Sharon Solloway Richard Smith - “The ties that bind”
2007 Thomas O’Neill Ed Wolfe Sharon Solloway & Ed Wolfe George Engelhard, Jr. - “Historical trends in measurement research”
2008 Ed Wolfe Timothy Muckle Dimiter Dimitrov & Diana Birnbaum Paul de Boeck - “Explanatory item response models: a matrix representational framework”
2009 Ed Wolfe Timothy Muckle Diana Wilmot & Leigh Harrell Mark Moulton - “Classical, IRT, and MIRT: a primer on test equating”
2010 Michael Young Kenneth Royal Leigh Harrell & Stephen Jirka Brent Duckor - “Measuring teachers’ effectiveness”
2011 Michael Young Kenneth Royal Stephen Jirka & Daeryong Seo Mark Wilson, Xiaohui Zheng & Leah Walker McGuire - “Formulating Latent Growth Using an Explanatory Item Response Model Approach”
2012 Tim O'Neil Kirk Becker Daeryong Seo & Kelly Bradley John H.A.L. De Jong - “Applying the Rasch Model: Integrated Skills Testing and Unidimensionality”